KITTEL, Charles,. Introdução à física do estado sólido. 8. ed. Rio de Janeiro: LTC, 2006. xix, 578 p. ISBN 9788521615057 (broch.).
HAMMOND, C. The basics of crystallography and diffraction. 3rd ed. Oxford, U.K.; New York, N.Y.: Oxford University Press, 2009. xiii, 432 p. (International Union of Crystallography Texts on Crystallography ; 12) ISBN 9780199546459 (broch.)
KLUG, Harold P.; ALEXANDER, Leroy E. X-ray diffraction procedures: for polycrystalline and amorphous materials. 2. ed. - New York: John &Sons, 1974. 966p.
LARSON, Allen C.; VON DREELE, Robert B. Gsas. General Structure Analysis System. LANSCE, MS-H805, Los Alamos, New Mexico, 1994.
MCCUSKER, L. B. et al. Rietveld refinement guidelines. Journal of Applied Crystallography, v. 32, n. 1, p. 36-50, 1999.